Spectral domain Z-scan technique

Characterizing the nonlinear optical properties of various materials plays a prerequisite role in optics. Among different measurement methods, well-known Z-scan technique and modified versions have been recognized as simple accurate methods for measuring both real imaginary parts refractive index. However, based on detecting small beam variations impose severe restriction roughness materials. Therefore, highly scattering media still remain challenging. Inspired by innovation conventional method that replaces wavefront phase shift spatial pattern far-field, spectral domain is presented this paper. It has great potential characterizing index medium, since efficiency insensitive to wavelength Mie scattering, which occurs wavelengths far smaller than roughness. Moreover, demonstrate advantages technique, refractions polished slides frosted were measured, agree well with previous reports.